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PSAM 16 Conference Paper Overview

Welcome to the PSAM 16 Conference paper and speaker overview page.

Lead Author: Achim Benz Co-author(s): Alexander Grundler, alexander.grundler@ima.uni-stuttgart.de Martin Dazer, martin.dazer@ima.uni-stuttgart.de Bernd Bertsche, bernd.bertsche@ima.uni-stuttgart.de
Reliability Demonstration Test Planning for different Distributions of Field Load Spectra
In recent decades, product development cycles have become significantly shorter, with increasing reliability requirements and simultaneously decreasing budgets for tests. Even though a lot of knowledge about the failure behavior of the product can be generated by simulations, in the end a test is needed to demonstrate the reliability of the product. In order to select a test that optimally uses the resources of time, cost and number of samples for the desired reliability level with a sufficient confidence level, a simulation is performed. Previous work by Herzig et al. and Grundler et al. applied the concept of Probability of Success (PoS) for Success Run and End of Life tests introduced by Dazer et al. to consider accelerated Success Run and End of Life tests besides different failure mechanisms. This involved Monte Carlo simulations to derive the correlations of a successful test with the costs incurred, time, number of samples and the achievable demonstrated reliability. Previous work by Benz et al. introduces the concept of PoS for field load spectra deriving the demonstrated damage. This work led to questions dealing with the MLE bias correction that is needed when the individual load levels of the load profile are evaluated. Also the extrapolation error for accelerated tests to field level need to be investigated for different distributions of load spectra. For this purpose, a parameter study for individual parameters and test load levels of a test scenario will be evaluated in order to quantify multiple bias correction methods and the impact of distributions shapes of load spectra.

Paper AC15 Preview

Author and Presentation Info

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Lead Author Name: Achim Benz (achim.benz@ima.uni-stuttgart.de)

Bio: Achim Benz studied Mechanical Engineering at the University of Stuttgart in Germany and received his academic degree Master of Science in 2018. He is working as a research assistant in the field of reliability engineering at the Institute of Machine Components. He is pursuing his Ph.D. studies with a focus on life testing for power electronics such as inverters etc.

Country: Germany
Company: Institut of Machine Components
Job Title: Research Assistant

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